讲座通知：
德国联邦物理技术研究院(PTB) Koenders教授扫描探针显微镜(SPM)技术系列专题讲座
主题: 扫描隧道显微镜（STM），原子力显微镜（AFM）和扫描电子显微 （SEM）的原理及应用
时间及地点：5月17日下午3:00-4:30综合楼D505（STM）；
5月18日上午9:55-11：30 综合楼 D105（AFM）；
5月20日 上午 9:55-11:30 综合楼 D106-108（SEM）；
欢迎全校师生踊跃参加！
讲座摘要：
Scanning tunneling microscope, Atomic for microscope and Scanning electrical microscope are also reference as scanning probe microscopes (SPM). While the pure imaging capabilities of SPM techniques is dominated by the application of these methods at their early development stages, the physics of probe–sample interactions and the quantitative analyses of tribological, electronic, magnetic, biological, and chemical surfaces have now become of increasing interest. Nanoscale science and technology are strongly driven by SPMs which allow investigation and manipulation of surfaces down to the atomic scale. With growing understanding of the underlying interaction mechanisms, SPMs have found applications in many fields outside basic research fields. In addition, various derivatives of all these methods have been developed for special applications, some of them targeted far beyond microscopy.
The Scanning Tunneling Microscope (STM) developed by Dr.Gerd Binnig and his colleagues in 1981 at the IBM Zurich Research Laboratory, Rueschlikon, Switzerland, is the first instrument capable of directly obtaining three-dimensional (3-D) images of solid surfaces with atomic resolution. While. STMs can only be used to study surfaces which are electrically conductive to some degree. In 1985, Binnig et al. developed an Atomic Force Microscope (AFM) to measure ultra-small forces (less than 1μN) present between the AFM tip surface and the sample surface. AFMs can be used for measurement of all engineering surfaces which may be either electrically conductive or insulating. The AFM has become a popular surface profiler for topographic and normal force measurements on the micro to nanoscale. Scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum, in low vacuum, in wet conditions (in environmental SEM), and at a wide range of cryogenic or elevated temperatures.
Head of the department
Surface Metrology
Physikalisch-Technische Bundesanstalt (PTB),
38116 Braunschweig
Germany
Phone:+49(0)531 592 5100
e-mail: Ludger.Koenders@ptb.de
Ludger Koenders joined, after finishing his PhD work on surface physics of III-V semiconductors, the German national metrology institute Physikalisch-Technische Bundesanstalt (PTB) in 1989. In the first years he investigated crystalline samples (Silicon, GaAs, ...) with a Scanning Tunnelling Microscope (STM) in Ultra-High-Vacuum. Later on he started his work on the development on Atomic Force Microscopes (AFM) for dimensional metrology. This includes the set-up of instruments and development of standards. He has coordinated several European and international comparisons on the field of step height, pitch and roughness measurements for stylus, optical (phase-shift, white-light, con-focal) and atomic force microscopes. Since 2006 he is the head of the department Surface Metrology in the PTB and in charge for roughness, thickness, hardness and nanoforce measurements.
He is a member of several national and international committees on the development of guidelines for AFM and optical microscopes, on surface roughness and on surface analyses.
Together with the Nanometrology group of the EURAMET Technical Committee for Length, he organizes the NanoScale seminar which is biennial conference on nanoscale metrology.
Publications:
Over 108 papers, articles, book chapter.
Over 1269 citations, and 112.95 total impact points.
Some published papers are listed as following:
[1].Nesterov, V., Buetefisch, S., Koenders, L.; A nanonewton force facility to test Newton’s law of gravity at micro- and submicrometer distances, Ann. Phys. (Berlin) 525, No. 8–9, 728–737 (2013) doi:10.1002/andp.201300057
[2].Chen, X. , Wolff, H. Koenders, L.; Atomic force microscope cantilevers as encoder for real-time displacement measurement, Proc. SPIE 8378, 83780C (2012);http://dx.doi.org/10.1117/12.923005
[3].Yacoot, A. and Koenders, L; Recent developments in dimensional nanometrology using AFMs, Meas. Sci. Technol. 22 (2011) 122001 (12pp), doi:10.1088/0957-0233/22/12/122001
[4].Dai, G., Häßler-Grohne, W., Hüser, D., Wolff, H., Danzebrink, H.-U., Koenders, L. Bosse, H.; Development of a 3D AFM for true 3D measurements of nanostrucutures, Measurement Science and Technology 22 (2011) 094009 doi:10.1088/0957-0233/22/9/094009
[5].Yacoot, A., Koenders, L.; (Topical Review) Aspects of scanning force microscope probes and their effects on dimensional measurement, J. Phys. D: Appl. Phys. 41 (2008) 103001doi:10.1088/0022-3727/41/10/103001 (46pp)
Book:
[1]Wilkening, G., Koenders, L., Nanoscale Calibration Standards and Methods - Dimensional and Related Measurements in the Micro- and Nanometer Range, 2005. XXII, 519 pages, Hardcover, Wiley-VCH, Berlin